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New modeling of the power diode using the VHDL-AMS language

Published online by Cambridge University Press:  19 December 2007

M. Najjari ,
H. Mnif ,
H. Samet  and
N. Masmoudi
M. Najjari
Affiliation:
Laboratoire d'électroniques et information technologique, École Nationale d'Ingénieurs de Sfax, Route Soukra km 4, PB W, 3038 Sfax, Tunisia
H. Mnif
Affiliation:
Laboratoire d'électroniques et information technologique, École Nationale d'Ingénieurs de Sfax, Route Soukra km 4, PB W, 3038 Sfax, Tunisia
H. Samet
Affiliation:
Laboratoire d'électroniques et information technologique, École Nationale d'Ingénieurs de Sfax, Route Soukra km 4, PB W, 3038 Sfax, Tunisia
N. Masmoudi*
Affiliation:
Laboratoire d'électroniques et information technologique, École Nationale d'Ingénieurs de Sfax, Route Soukra km 4, PB W, 3038 Sfax, Tunisia
*
Nouri.Masmoudi@enis.rnu.tn
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Abstract

Design of integrated power systems requires prototype-less approaches. Accurate simulations are necessary for analysis and verification purposes. Simulation relies on component models and associated parameters. This paper focuses on an implementation of a physic-based analytical PIN diode model [Power Electron. 8, 342 (1993)] with the very high description language VHDL-AMS [IEEE Computer Society, IEEE Draft Standard VHDL-AMS Language Reference Manual, 1997]. The Lumped Charge (LC) concept of Linvill is employed. The state-of-art of parameter extraction methods is briefly recalled and a step-by-step extraction procedure for the model parameters is described. Due to poor agreement between simulation results and experimental data, an improvement is added to the model. Finally, our improved model is validated with a confrontation of the simulated and the experimental curves for both current and voltage at different range of the operating conditions. All this operation was made under the Free version of the “SIMPLORER©-SV 7.0” environment.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 41 , Issue 1 , January 2008 , pp. 1 - 11
Copyright
© EDP Sciences, 2007

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