Hostname: page-component-cd9895bd7-p9bg8 Total loading time: 0 Render date: 2024-12-25T18:00:49.958Z Has data issue: false hasContentIssue false
  • English
  • Français

Extracting chemical information from single-wavelength X-ray reflectivity data

Chemical information from X-ray reflectivity data

Published online by Cambridge University Press:  23 April 2013

Fethi Salah ,
Besma Harzallah ,
Thiphaine Mérian ,
Dominique Debarnot ,
Fabienne Poncin-Epaillard  and
Arie van der Lee
Fethi Salah
Affiliation:
Laboratoire Physico-Chimie des Matériaux, Département de Physique, Faculté des Sciences de Monastir, Université de Monastir, avenue de l’Environnement, 5019 Monastir, Tunisia
Besma Harzallah
Affiliation:
Laboratoire Physico-Chimie des Matériaux, Département de Physique, Faculté des Sciences de Monastir, Université de Monastir, avenue de l’Environnement, 5019 Monastir, Tunisia
Thiphaine Mérian
Affiliation:
LUNAM Université, Université du Maine, CNRS UMR 6283, Institut des Molécules et Matériaux du Mans, Département Polyméres, Colloïdes et Interfaces, avenue Olivier Messiaen, 72085 Le Mans Cedex 9, France
Dominique Debarnot
Affiliation:
LUNAM Université, Université du Maine, CNRS UMR 6283, Institut des Molécules et Matériaux du Mans, Département Polyméres, Colloïdes et Interfaces, avenue Olivier Messiaen, 72085 Le Mans Cedex 9, France
Fabienne Poncin-Epaillard
Affiliation:
LUNAM Université, Université du Maine, CNRS UMR 6283, Institut des Molécules et Matériaux du Mans, Département Polyméres, Colloïdes et Interfaces, avenue Olivier Messiaen, 72085 Le Mans Cedex 9, France
Arie van der Lee*
Affiliation:
Institut Européen des Membranes, UMR-CNRS 5635, Université de Montpellier II, Place Eugène Bataillon, cc 047, 34095 Montpellier Cedex 5, France
*
ae-mail: avderlee@univ-montp2.fr
Get access

Abstract

The possibilities for extracting chemical composition-related information from a singlewavelength X-ray reflectometry experiment are investigated. It is shown that the X-ray absorption of certain elements is sufficient to cause a significant effect on the reflectivity curve, which can be in turn exploited to determine its abundance in the thin film. The limitations are discussed using simulated data and the methodology is applied for the determination of the iodine concentration in iodine-treated thin polyaniline films. More generally the method appears to be very sensitive for the non-destructive determination of the weight percentage of metal nanoparticles in thin polymer films.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 62 , Issue 1 , April 2013 , 10304
Copyright
© EDP Sciences, 2013

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Windt, D.L., Comput. Phys. 12, 360 (2005)CrossRef
Bruker-AXS, Diffracplus LEPTOS – The Comprehensive Nanometer X-ray Analysis Tool (Bruker-AXS, Karlsruhe, Germany, 1995–2006)
Creagh, D.C., McAuley, W.J., X-ray Dispersion Corrections, Vol. C: Mathematical, Physical and Chemical Tables of International Tables for Crystallography (International Union of Crystallography, Kluwer, Chester, UK, 1995), Chap. 4.2.6Google Scholar
Banerjee, S., Park, Y.J., Lee, D.R., Jeong, Y.H., Lee, K.B., Yoon, S.B., Choi, H.M., Park, J.C., Roh, J.S., Sanyal, M.K., Appl. Surf. Sci. 136, 41 (1998)CrossRef
Vaknin, D., Krüger, P., Lösche, M., Phys. Rev. Lett. 90, 178102 (2003)CrossRef
Park, C., Fenter, P.A., Sturchio, N.C., Regalbuto, J.R., Phys. Rev. Lett. 94, 076104 (2005)CrossRef
van der Lee, A., Roualdes, S., Berjoan, R., Durand, J., Appl. Surf. Sci. 173, 115 (2001)CrossRef
Airoudj, A., Debarnot, D., Bêche, B., Poncin-Epaillard, F., Anal. Chim. Acta 626, 44 (2008)CrossRef
Salah, F., Harzallah, B., van der Lee, A., J. Appl. Cryst. 40, 813 (2007)CrossRef
Nelson, A., J. Appl. Cryst. 39, 273 (2006)CrossRef
Banerjee, S., Sanyal, M.K., Datta, A., Kanakaraju, S., Mohan, S., Phys. Rev. B 54, 16377 (1996)CrossRef
Marsh, R.J., Jones, R.A.L., Sferrazza, M., Penfold, J., J. Colloid Interface Sci. 218, 347 (1999)CrossRef
Grüll, H., Schreyer, A., Berk, N.F., Majkrzak, C.F., Han, C.C., Europhys. Lett. 50, 107 (2000)CrossRef