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Non destructive testing of works of art by terahertz analysis

Published online by Cambridge University Press:  15 November 2013

Jean-Luc Bodnar ,
Jean-Jacques Metayer ,
Kamel Mouhoubi  and
Vincent Detalle
Jean-Luc Bodnar*
Affiliation:
GRESPI/ ECATHERM, UFR Sciences Exactes et Naturelles, BP 1039, 51687 Reims, France
Jean-Jacques Metayer
Affiliation:
VISIOM, Parc de haute Technologie, 13 rue Alexis de Tocqueville, SILIC 41, 92182 Antony, France
Kamel Mouhoubi
Affiliation:
GRESPI/ ECATHERM, UFR Sciences Exactes et Naturelles, BP 1039, 51687 Reims, France
Vincent Detalle
Affiliation:
LRMH, 29 avenue du Paris, 77420 Champs-sur-Marne, France
*
ae-mail: jean-luc.bodnar@univ-reims.fr
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Abstract

Improvements in technologies and the growing security needs in airport terminals lead to the development of non destructive testing devices using terahertz waves. Indeed, these waves have the advantage of being, on one hand, relatively penetrating. They also have the asset of not being ionizing. It is thus potentially an interesting contribution in the non destructive testing field. With the help of the VISIOM Company, the possibilities of this new industrial analysis method in assisting the restoration of works of art were then approached. The results obtained within this framework are presented here and compared with those obtained by infrared thermography. The results obtained show first that the THZ method, like the stimulated infrared thermography allows the detection of delamination located in murals paintings or in marquetries. They show then that the THZ method seems to allow detecting defects located relatively deeply (10 mm) and defects potentially concealed by other defects. It is an advantage compared to the stimulated infra-red thermography which does not make it possible to obtain these results. Furthermore, they show that the method does not seem sensitive to the various pigments constituting the pictorial layer, to the presence of a layer of “Japan paper” and to the presence of a layer of whitewash. It is not the case of the stimulated infrared thermography. It is another advantage of the THZ method. Finally, they show that the THZ method is limited in the detection of low-size defects. It is a disadvantage compared to the stimulated infrared thermography.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 64 , Issue 2 , November 2013 , 21001
Copyright
© EDP Sciences, 2013

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