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An Improvement Over the Information Lower Bound in Binomial Group Testing

Published online by Cambridge University Press:  27 July 2009

Y.C. Yao
Affiliation:
Department of StatisticsColorado State University, Fort Collins, Colorado 80523

Abstract

The group-testing problem for a binomial set of items is considered. It is desired to classify all items as good or defective with a minimum expected number of group tests. An improvement over the information lower bound, via a weak concavity property, is made for the minimum expected number of group tests.

Type
Articles
Copyright
Copyright © Cambridge University Press 1988

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References

Berger, T., Mehravari, N., Towsley, D., & Wolf, J. (1984). Random multiple-access communication and group testing. IEEE Transactions on Communication C-34: 769779.Google Scholar
Sobel, M. & Groll, P.A. (1959). Group testing to eliminate efficiently all defectives in a binomial sample. Bell System Technical Journal 38: 11791252.Google Scholar
Ungar, P. (1960). The cut-off point in group testing. Communication on Pure and Applied Mathematics 13: 4954.Google Scholar
Yao, Y.C. & Hwang, F.K. (1988). Individual testing of independent items in optimal group testing. Probability in Engineering and Informational Sciences 2: 2329.Google Scholar