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30 - RF test equipment

Published online by Cambridge University Press:  05 June 2012

Jon B. Hagen
Affiliation:
Cornell University, New York
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Summary

In RF work, as in low-frequency work, test instruments generally are designed either to analyze signals, or to determine parameters of components and systems. Signal analysis ranges from simple voltage, current, and power measurements to measurements of frequency, relative phase, frequency stability, modulation characteristics, RF field strength, and spectrum analysis. Parameter measurements range from simple resistance and reactance measurements through measurements of transfer characteristics of linear multiport devices (filter shapes, amplifier frequency response, etc.), and distortion (dynamic range, intermodulation). Parameter measurements require a signal generator to provide the stimulus whose response is measured. It is now common for measurement instruments to include built-in signal generators, but free-standing signal generators are widely used in specialized test setups.

Power measurements

Power measurements, as pointed out in Chapter 18, are best made with a square-law detector. If the waveform is unknown or noisy (i.e., has a random component), a square-law detector must be used, as power, by definition, is proportional to the average square of voltage. If the signal waveform is known, e.g., a sine wave, the power can also be calculated, for example, from a measurement of 〈|V(t)|〉. Commercial RF power meters normally present a 50-ohm impedance to source being measured, allowing a reflectionless connection to a 50-ohm cable.

Thermistor (temperature-dependent resistor) power meters are true square-law instruments and have a dynamic range typically from 1 μW (−30 dBm) to 100 mW (20 dBm). The power to be measured heats a thermistor which is one leg of a Wheatstone bridge circuit.

Type
Chapter
Information
Radio-Frequency Electronics
Circuits and Applications
, pp. 422 - 433
Publisher: Cambridge University Press
Print publication year: 2009

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References

Hewlett Packard Application Note 1287–1 “Understanding the fundamental principles of vector network analyzers.”
Hewlett Packard Application Note 1287–2 “Exploring the architecture of vector network analyzers.”
Hewlett Packard Application Note 1287–3 “Applying error corrections to vector network analyzer measurements.”

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  • RF test equipment
  • Jon B. Hagen, Cornell University, New York
  • Book: Radio-Frequency Electronics
  • Online publication: 05 June 2012
  • Chapter DOI: https://doi.org/10.1017/CBO9780511626951.031
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  • RF test equipment
  • Jon B. Hagen, Cornell University, New York
  • Book: Radio-Frequency Electronics
  • Online publication: 05 June 2012
  • Chapter DOI: https://doi.org/10.1017/CBO9780511626951.031
Available formats
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Save book to Google Drive

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  • RF test equipment
  • Jon B. Hagen, Cornell University, New York
  • Book: Radio-Frequency Electronics
  • Online publication: 05 June 2012
  • Chapter DOI: https://doi.org/10.1017/CBO9780511626951.031
Available formats
×