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9 - Cryogenic systems

Published online by Cambridge University Press:  05 June 2012

I. R. Walker
Affiliation:
University of Cambridge
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Summary

Introduction

Lack of reliability in cryogenic apparatus is an especially troublesome problem. This is partly because of the inherent susceptibility of such apparatus to breakdowns. The difficulties are magnified by the inaccessibility of the low-temperature components while they are in their working environment, which makes troubleshooting difficult, and immediate repair of faults virtually impossible. Because of the long times that are often needed to cool the equipment down and warm it up again, the correction and detection of defective items can be a very tedious process. Some faults that manifest themselves at low temperatures may vanish when the apparatus is warmed to room temperature. Frequently, it is possible to identify and locate these only through the use of laborious cross-checks. The high cost of liquid cryogens, and especially liquid helium, can lead to large expenditures when low-temperature faults appear. For these reasons, particular care is needed in the design, construction, and use of cryogenic equipment to prevent failures from occurring.

Reliability problems in cryogenic apparatus are primarily the result of the following effects.

  1. (a) Leaks can occur into evacuated spaces used to provide thermal insulation. Even if such leaks are of negligible size at room temperature, they may become very large at low temperatures, owing to the special properties of gases and liquids under such conditions.

  2. (b) Mechanical stresses are produced in the various parts during thermal cycling. These stresses are caused by differences in thermal expansion coefficients and temperature gradients. They can cause tubes to bend, wires and solder joints to break, leaks to form, and moving parts to seize. Fatigue failure (see Section 3.11) is potentially a serious issue. […]

Type
Chapter
Information
Reliability in Scientific Research
Improving the Dependability of Measurements, Calculations, Equipment, and Software
, pp. 285 - 309
Publisher: Cambridge University Press
Print publication year: 2011

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References

Pobell, F., Matter and Methods at Low Temperatures, 2nd edn, Springer, 1996.
Ekin, J. W., Experimental Techniques for Low-Temperature Measurements: Cryostat Design, Material Properties, and Superconductor Critical-Current Testing, Oxford University Press, 2006.
White, G. K. and Meeson, P. J., Experimental Techniques in Low-Temperature Physics, 4th edn, Oxford University Press, 2002.
Murphy, G. J. and Pearce, P. O., in Applied Cryogenic Engineering, Vance, R. W. and Duke, W. M. (eds.), John Wiley & Sons, 1962.
Safety Matters for Cryogenic and High Magnetic Field Systems – Issue 1.2, Oxford Instruments Ltd, 1995. Address: Old Station Way, Eynsham, Witney, Oxon, UK. www.oxinst.com
Croft, A. J., Cryogenics 3, 65 (1963).
Balshaw, N. H., Practical Cryogenics: an Introduction to Laboratory Cryogenics, Oxford Instruments Superconductivity Ltd., 2001.
Daney, D. E., Dillard, J. E., and Forsha, M. D., in Handbook of Cryogenic Engineering, Weisend, J. G. II (ed.), Taylor & Francis, 1998.
Fuller, P. D. and McLagan, J. N., in Applied Cryogenic Engineering, Vance, R. W. and Duke, W. M. (eds.), John Wiley & Sons, 1962.
Abrikosova, I. I. and Shal, A. I.'nikov, Instrum. Experiment. Techniques 2, 593 (1970).
Nunes, G., Jr., and Earle, K. A., in Experimental Techniques in Condensed Matter Physics at Low Temperatures, Richardson, R. C. and Smith, E. N. (eds.), Addison-Wesley, 1988.
Nunes, G., Jr., in Experimental Techniques in Condensed Matter Physics at Low Temperatures, Richardson, R. C. and Smith, E. N. (eds.), Addison-Wesley, 1988.
Richardson, R. C. and Smith, E. N. (eds.), Experimental Techniques in Condensed Matter Physics at Low Temperatures, Addison-Wesley, 1988.
Hands, B. A., in Cryogenic Engineering, Hands, B. A. (ed.), Academic Press, 1986.
Thompson, J. R. and Thomson, J. O., Rev. Sci. Instrum. 49, 1485 (1978).
Landau, J. and Rosenbaum, R., Rev. Sci. Instrum. 43, 1540 (1972).
Salerno, L. J. and Kittel, P., in Handbook of Cryogenic Engineering, Weisend, J. G.II (ed.), Taylor & Francis, 1998.
Walker, I. R., Cryogenics 45, 87 (2005). (This reference contains information about the low temperature mechanical properties of beryllium–copper and MP35N).
Tallis, W. J., in Cryogenic Engineering, Hands, B. A. (ed.), Academic Press, 1986.
Touloukian, Y. S., Kirby, R. K., Taylor, R. E., and Desai, P. D., Thermal Expansion – Metallic Elements and Alloys, Plenum, 1975.
Didschuns, I., Woodcraft, A. L., Bintley, D., and Hargrave, P. C., Cryogenics 44, 293 (2004).
Croft, A. J., Cryogenic Laboratory Equipment, Plenum, 1970.
Krause, J. K. and Swinehart, P. R., Photonics Spectra, pp. 61–68, August 1985.
Installation and Application Notes for Cryogenic Sensors – Rev. 3/77, Lake Shore Cryotronics, Inc., 575 McCorkle Blvd., Westerville, OH, USA. www.lakeshore.com
Holmes, D. S. and Courts, S. S., in Handbook of Cryogenic Engineering, Weisend, J. G.II (ed.), Taylor & Francis, 1998.
Anderson, A. C., Rev. Sci. Instrum. 51, 1603 (1980).
Germain, R. S., in Experimental Techniques in Condensed Matter Physics at Low Temperatures, Richardson, R. C. and Smith, E. N. (eds.), Addison-Wesley, 1988.
Horowitz, P. and Hill, W., The Art of Electronics, 2nd edn, Cambridge University Press, 1989.
Temperature Measurement and Control – 1995 part 1 (catalogue), Lake Shore Cryotronics, Inc., 575 McCorkle Blvd., Westerville, OH, USA. www.lakeshore.com
Ricketson, B.W., in Cryogenic Engineering, Hands, B. A. (ed.), Academic Press, 1986.
Betts, B., IEEE Spectrum 43, No. 4, 50 (2006).

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  • Cryogenic systems
  • I. R. Walker, University of Cambridge
  • Book: Reliability in Scientific Research
  • Online publication: 05 June 2012
  • Chapter DOI: https://doi.org/10.1017/CBO9780511780608.010
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  • Cryogenic systems
  • I. R. Walker, University of Cambridge
  • Book: Reliability in Scientific Research
  • Online publication: 05 June 2012
  • Chapter DOI: https://doi.org/10.1017/CBO9780511780608.010
Available formats
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Save book to Google Drive

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  • Cryogenic systems
  • I. R. Walker, University of Cambridge
  • Book: Reliability in Scientific Research
  • Online publication: 05 June 2012
  • Chapter DOI: https://doi.org/10.1017/CBO9780511780608.010
Available formats
×