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Soft X‐Ray Studies of Y‐Ba‐Cu‐O Thin Films Prepared by Laser Ablation

Published online by Cambridge University Press:  28 February 2011

A. Krol ,
C.J. Sher ,
D.R. Storch ,
L.W. Song ,
Y.H. Kao ,
S. Witanachi ,
Y.Z. Zhu ,
S. Patel ,
D.T. Shaw  and
G.C. Smith
A. Krol
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, NY 14260
C.J. Sher
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, NY 14260
D.R. Storch
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, NY 14260
L.W. Song
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, NY 14260
Y.H. Kao
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, NY 14260
S. Witanachi
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, NY 14260
Y.Z. Zhu
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, NY 14260
S. Patel
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, NY 14260
D.T. Shaw
Affiliation:
New York State Institute on Superconductivity and State University of New York at Buffalo, Buffalo, NY 14260
G.C. Smith
Affiliation:
Brookhaven National Laboratory, Instrumentation Division, Upton, NY 11973
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Abstract

Angular variation of x‐ray fluorescence due to oxygen atoms in high‐T Y‐Ba‐Cu‐O thin films is measured for the first time by using a new parallel plate avalanche chamber. This technique allows the possibility of nondestructive probing of the depth‐profile of oxygen atoms in the superconducting materials. Our preliminary results indicate that the near surface region of the Y‐Ba‐Cu‐O film may contain an oxygen‐depleted layer of thickness around 20 nm.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 169: Symposium M – High Temperature Superconductors: Fundamental Properties and Novel Materials Processing , 1989 , 505
Copyright
Copyright © Materials Research Society 1990

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References

1 Krol, A., Sher, C.J., Ming, Z.H., Lin, C.S., Song, L.W., Kao, Y.H., Smith, G.C., Zhu, Y.Z. and Shaw, D.T., Proc. Third Buffalo Conference on Superconductivity, in press.Google Scholar
2 Smith, G.C., Krol, A. and Kao, Y.H., preprint.Google Scholar
3 Shaw, D.T. et al., preprint.Google Scholar
4 Krol, A., Sher, C.J. and Kao, Y.H., Phys. Rev. B 38 (1988) 8579.Google Scholar
5 Krol, A., Lin, C.S., Sher, C.J., Ming, Z.H., Kao, Y.H., Chen, C.T., Sette, F., Ma, Y., Smith, G.C., Zhu, Y.Z. and Shaw, D.T., preprint.Google Scholar