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Lama III - A Computer Program for Quantitative XRFA of Bulk Specimens and Thin Film Layers

Published online by Cambridge University Press:  06 March 2019

Michael Mantler
Michael Mantler*
Affiliation:
IBM Research laboratory, San Jose, California 95193
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Abstract

The previous LAMA I and II programs have been completely rewritten in this new version. Better precision and an order of magnitude increase in speed were achieved with a different numerical method and more efficient code. Fundamental parameters and/or empirical parameter calculations can be used. New routines for the analysis of oxides and other compounds of light elements, and multiple thin film layers with secondary enhancement factors are included.

Information

Type
VII. Mathematical Models and Computer Applications in XRF
Information
Advances in X-Ray Analysis , Volume 27: Thirty-Second Annual Conference on Applications of X-ray Analysis, August 1-5, 1983 , 1983 , pp. 433 - 440
Copyright
Copyright © International Centre for Diffraction Data 1983

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References

1. Laguitton, D. and Mantler, M., LAMA I-A General Fortran Program for Quantitative X-Ray Fluorescence Analysis, Adv. in X-Ray Anal. 20:515 (1977).Google Scholar
2. Huang, T. C., Quantiative X-Ray Fluorescence Analysis of Thin Films Using LAMA-2, X-Ray Spectrom. 10:28 (1981).Google Scholar
3. Sherman, J., The Theoretical Derivation of X-Ray intensities from Mixtures, Spectrochim. Acta 7:283 (1955); ibid. 14:466 (1959).Google Scholar
4. Shiraiwa, T. and Fujino, N., Theoretical Calculation of Fluorescent X-Ray Intensities in Fluorescent X-Ray Spectrochemical Analysis, Japanese J. Appl. Phys. 5:10,886 (1966).Google Scholar
5. McMaster, W. H., DelGrande, N. K., Mallett, J. H., and Hubbell, J. H., Compilation of X-Ray Cross Section, UCRL-50174 Sec. 2-R1, Lawrence Rad. Lab., Livermore, California 94550 (1969).Google Scholar
6. Gilfrich, J. V. and Birks, L. S., Spectral Distribution of X-Ray Tubes for Quantitative X-Ray Fluorescence Analysis, Anal. Chem. 40:7, 1077 (1968).Google Scholar
7. Mantler, M., A New Method for Quantitative X-ray Fluorescence Analysis of Mixtures of Oxides or Other Compounds by Empirical Parameter Methods, Adv. in X-Ray Anal. 26:351(1983).Google Scholar