Crossref Citations
This Book has been
cited by the following publications. This list is generated based on data provided by Crossref.
Engstrom, Olof
Przewlocki, Henryk M.
Mitrovic, Ivona Z.
and
Hall, Stephen
2014.
Internal photoemission technique for high-k oxide/semiconductor band offset determination: The influence of semiconductor bulk properties.
p.
369.
Bonilla, Ruy S.
Hoex, Bram
Hamer, Phillip
and
Wilshaw, Peter R.
2017.
Dielectric surface passivation for silicon solar cells: A review.
physica status solidi (a),
Vol. 214,
Issue. 7,
Piskorski, K
Niemiec, M
Borowicz, L
and
Przewlocki, H M
2017.
A measurement system for the photoelectric and electrical characterization of modern semiconductor devices.
Measurement Science and Technology,
Vol. 28,
Issue. 5,
p.
055012.
Lu, Han-Han
Liu, Lu
Xu, Jing-Ping
Lai, Pui-To
and
Tang, Wing-Man
2017.
Improved Interfacial and Electrical Properties of GaAs MOS Capacitor With LaON/TiON Multilayer Composite Gate Dielectric and LaON as Interfacial Passivation Layer.
IEEE Transactions on Electron Devices,
Vol. 64,
Issue. 4,
p.
1535.
Korolevych, Liubomyr Mykolaiovych
and
Borysov, Oleksandr Vasyliovych
2018.
The Criterion for Choosing an Insulator for Sili-con MOS Structures.
Microsystems, Electronics and Acoustics,
Vol. 23,
Issue. 6,
p.
6.
Piskorski, Krzysztof
Przewlocki, Henryk M.
Passi, Vikram
Ruhkopf, Jasper
and
Lemme, Max C.
2018.
Photoelectric Measurements of the Modern Graphene-Insulator-Semiconductor (GIS) Test Structures.
p.
319.
Korolevych, Lyubomyr
and
Borisov, Alexander
2019.
Cerium dioxide thin films in silicon MIS devices.
p.
305.
Holden, Konner E. K.
Hall, Gavin D. R.
Cook, Michael
Kendrick, Chris
Pabst, Kaitlyn
Greenwood, Bruce
Daugherty, Robin
Gambino, Jeff P.
and
Allman, Derryl D. J.
2021.
Dielectric Relaxation, Aging and Recovery in High-K MIM Capacitors.
p.
1.
Gatel, C.
Serra, R.
Gruel, K.
Masseboeuf, A.
Chapuis, L.
Cours, R.
Zhang, L.
Warot-Fonrose, B.
and
Hÿtch, M. J.
2022.
Extended Charge Layers in Metal-Oxide-Semiconductor Nanocapacitors Revealed by
Operando
Electron Holography.
Physical Review Letters,
Vol. 129,
Issue. 13,
Cowie, Megan
Stock, Taylor J. Z.
Constantinou, Procopios C.
Curson, Neil J.
and
Grütter, Peter
2024.
Spatially Resolved Dielectric Loss at the
Si/SiO2
Interface.
Physical Review Letters,
Vol. 132,
Issue. 25,