Book contents
- Frontmatter
- Contents
- Preface to the second English edition
- Preface to the first edition
- Introduction
- 1 Abbe's sine condition
- 2 Fourier optics
- 3 Effect of polarization on diffraction in systems of high numerical aperture
- 4 Gaussian beam optics
- 5 Coherent and incoherent imaging
- 6 First-order temporal coherence in classical optics
- 7 The van Cittert–Zernike theorem
- 8 Partial polarization, Stokes parameters, and the Poincaré sphere
- 9 Second-order coherence and the Hanbury Brown–Twiss experiment
- 10 What in the world are surface plasmons?
- 11 Surface plasmon polaritons on metallic surfaces
- 12 The Faraday effect
- 13 The magneto-optical Kerr effect
- 14 The Sagnac interferometer
- 15 Fabry–Pérot etalons in polarized light
- 16 The Ewald–Oseen extinction theorem
- 17 Reciprocity in classical linear optics
- 18 Optical pulse compression
- 19 The uncertainty principle in classical optics
- 20 Omni-directional dielectric mirrors
- 21 Linear optical vortices
- 22 Geometric-optical rays, Poynting's vector, and the field momenta
- 23 Doppler shift, stellar aberration, and convection of light by moving media
- 24 Diffraction gratings
- 25 Diffractive optical elements
- 26 The Talbot effect
- 27 Some quirks of total internal reflection
- 28 Evanescent coupling
- 29 Internal and external conical refraction
- 30 Transmission of light through small elliptical apertures
- 31 The method of Fox and Li
- 32 The beam propagation method
- 33 Launching light into a fiber
- 34 The optics of semiconductor diode lasers
- 35 Michelson's stellar interferometer
- 36 Bracewell's interferometric telescope
- 37 Scanning optical microscopy
- 38 Zernike's method of phase contrast
- 39 Polarization microscopy
- 40 Nomarski's differential interference contrast microscope
- 41 The van Leeuwenhoek microscope
- 42 Projection photolithography
- 43 Interaction of light with subwavelength structures
- 44 The Ronchi test
- 45 The Shack–Hartmann wavefront sensor
- 46 Ellipsometry
- 47 Holography and holographic interferometry
- 48 Self-focusing in nonlinear optical media
- 49 Spatial optical solitons
- 50 Laser heating of multilayer stacks
- Index
- References
45 - The Shack–Hartmann wavefront sensor
Published online by Cambridge University Press: 31 January 2011
- Frontmatter
- Contents
- Preface to the second English edition
- Preface to the first edition
- Introduction
- 1 Abbe's sine condition
- 2 Fourier optics
- 3 Effect of polarization on diffraction in systems of high numerical aperture
- 4 Gaussian beam optics
- 5 Coherent and incoherent imaging
- 6 First-order temporal coherence in classical optics
- 7 The van Cittert–Zernike theorem
- 8 Partial polarization, Stokes parameters, and the Poincaré sphere
- 9 Second-order coherence and the Hanbury Brown–Twiss experiment
- 10 What in the world are surface plasmons?
- 11 Surface plasmon polaritons on metallic surfaces
- 12 The Faraday effect
- 13 The magneto-optical Kerr effect
- 14 The Sagnac interferometer
- 15 Fabry–Pérot etalons in polarized light
- 16 The Ewald–Oseen extinction theorem
- 17 Reciprocity in classical linear optics
- 18 Optical pulse compression
- 19 The uncertainty principle in classical optics
- 20 Omni-directional dielectric mirrors
- 21 Linear optical vortices
- 22 Geometric-optical rays, Poynting's vector, and the field momenta
- 23 Doppler shift, stellar aberration, and convection of light by moving media
- 24 Diffraction gratings
- 25 Diffractive optical elements
- 26 The Talbot effect
- 27 Some quirks of total internal reflection
- 28 Evanescent coupling
- 29 Internal and external conical refraction
- 30 Transmission of light through small elliptical apertures
- 31 The method of Fox and Li
- 32 The beam propagation method
- 33 Launching light into a fiber
- 34 The optics of semiconductor diode lasers
- 35 Michelson's stellar interferometer
- 36 Bracewell's interferometric telescope
- 37 Scanning optical microscopy
- 38 Zernike's method of phase contrast
- 39 Polarization microscopy
- 40 Nomarski's differential interference contrast microscope
- 41 The van Leeuwenhoek microscope
- 42 Projection photolithography
- 43 Interaction of light with subwavelength structures
- 44 The Ronchi test
- 45 The Shack–Hartmann wavefront sensor
- 46 Ellipsometry
- 47 Holography and holographic interferometry
- 48 Self-focusing in nonlinear optical media
- 49 Spatial optical solitons
- 50 Laser heating of multilayer stacks
- Index
- References
Summary
Roland Shack invented the device now known as the Shack–Hartmann wavefront sensor in the early 1970s. This sensor, which in recent years has been commercialized, measures the phase distribution over the cross-section of a given beam of light without relying on interference and, therefore, does not require a reference beam.
The standard method of wavefront analysis is interferometry, where one brings together on an observation plane the beam under investigation (hereinafter the test beam) and a reference beam in order to form tell-tale fringes. The trouble with interferometry is that it requires a reference beam, which is not always readily available. Moreover, the coherence length of the light used in these measurements must be long compared with the path-length difference between the reference and test beams. Thus, when the available light source happens to be broad-band, it becomes difficult (though by no means impossible) to produce high-contrast fringes. The Shack–Hartmann instrument solves these problems by eliminating altogether the need for the reference beam.
Wavefront analysis by interferometry
Before embarking on a discussion of the Shack–Hartmann wavefront sensor, it will be instructive to describe the operation of a conventional interferometer. Consider, for instance, the system of Figure 45.1, where a spherical mirror is under investigation. While grinding and polishing the glass blank, the optician frequently performs this type of test to determine departures of the surface from the desired figure. A point source reflected from a 50/50 beam-splitter is used to illuminate the test mirror.
- Type
- Chapter
- Information
- Classical Optics and its Applications , pp. 624 - 631Publisher: Cambridge University PressPrint publication year: 2009