Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 966
A Review of Strain Analysis Using Electron Backscatter Diffraction
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- Published online by Cambridge University Press:
- 22 March 2011, pp. 316-329
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- Cited by 685
Analysis of Three-dimensional Atom-probe Data by the Proximity Histogram
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- Published online by Cambridge University Press:
- 07 August 2002, pp. 437-444
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- Cited by 522
Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond
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- Published online by Cambridge University Press:
- 14 May 2019, pp. 563-582
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- Cited by 343
High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy
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- Published online by Cambridge University Press:
- 11 January 2016, pp. 237-249
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- Cited by 339
Review of Atom Probe FIB-Based Specimen Preparation Methods
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- Published online by Cambridge University Press:
- 14 November 2007, pp. 428-436
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- Cited by 277
New Techniques for the Analysis of Fine-Scaled Clustering Phenomena within Atom Probe Tomography (APT) Data
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- Published online by Cambridge University Press:
- 14 November 2007, pp. 448-463
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- Cited by 276
EBSD Image Quality Mapping
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- Published online by Cambridge University Press:
- 09 December 2005, pp. 72-84
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- Cited by 248
Automated Analysis of SEM X-Ray Spectral Images: A Powerful New Microanalysis Tool
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- 31 January 2003, pp. 1-17
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- Cited by 242
Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit
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- 16 September 2008, pp. 469-477
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- Cited by 233
SerialEM: A Program for Automated Tilt Series Acquisition on Tecnai Microscopes Using Prediction of Specimen Position
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- Published online by Cambridge University Press:
- 24 July 2003, pp. 1182-1183
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- Cited by 224
An Improved Cryogen for Plunge Freezing
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- 16 September 2008, pp. 375-379
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- Cited by 220
Vector Piezoresponse Force Microscopy
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- Published online by Cambridge University Press:
- 16 May 2006, pp. 206-220
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- Cited by 218
Computing Local Thickness of 3D Structures with ImageJ
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- Published online by Cambridge University Press:
- 05 August 2007, pp. 1678-1679
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- Cited by 207
Recent Advances in Electron Tomography: TEM and HAADF-STEM Tomography for Materials Science and Semiconductor Applications
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- Published online by Cambridge University Press:
- 26 September 2005, pp. 378-400
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- Cited by 177
Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 164-165
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- Cited by 168
Endothelial Cell-Pericyte Interactions Stimulate Basement Membrane Matrix Assembly: Influence on Vascular Tube Remodeling, Maturation, and Stabilization
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- Published online by Cambridge University Press:
- 14 December 2011, pp. 68-80
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- Cited by 165
First Data from a Commercial Local Electrode Atom Probe (LEAP)
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- 01 June 2004, pp. 373-383
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- Cited by 163
Enhancing Serial Block-Face Scanning Electron Microscopy to Enable High Resolution 3-D Nanohistology of Cells and Tissues
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- Published online by Cambridge University Press:
- 01 August 2010, pp. 1138-1139
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- Cited by 160
Spatial Distribution Maps for Atom Probe Tomography
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- 14 November 2007, pp. 437-447
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- Cited by 153
High-Resolution Transmission Electron Microscopy Using Negative Spherical Aberration
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- 17 March 2004, pp. 174-184
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