Plenary Session
Abstract
In-situ and Cryogenic Electron Microscopy for Energy Materials
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- 28 July 2020, p. 2
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Materials Science Applications
Revealing Solute Clusters in Coalescence by Atom Probe Tomography Analysis
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- 14 September 2020, pp. 1079-1087
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Software and Instrumentation
Atomic Resolution Imaging of Light Elements in a Crystalline Environment using Dynamic Hollow-Cone Illumination Transmission Electron Microscopy
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- 10 June 2020, pp. 623-629
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Materials Science Applications
Study on Quantitative Analysis of Carbon and Nitrogen in Stoichiometric θ-Fe3C and γ′-Fe4N by Atom Probe Tomography
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- 05 March 2020, pp. 185-193
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An Improved Electron Microprobe Method for the Analysis of Halogens in Natural Silicate Glasses
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- 10 August 2020, pp. 857-866
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In Situ EBSD Study of Stable Cube Texture in an Advanced Composite Substrate Used in YBCO-Coated Conductors
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- 23 April 2020, pp. 365-372
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15th Interamerican Microscopy Congress CIASEM - SAMIC; October 1–4, 2019, Buenos Aires, Argentina
Abstract
A Multi-Analytical Approach for the Study of the pigments Used to Decorate an Egyptian Cartonnage from Ptolemaic Period
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- 28 April 2020, pp. 1-2
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Letter to the Editor
Proliferation of Faulty Materials Data Analysis in the Literature
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- 17 January 2020, pp. 1-2
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15th Interamerican Microscopy Congress CIASEM - SAMIC; October 1–4, 2019, Buenos Aires, Argentina
Abstract
A Quantum Mechanics Treatment of Electron Diffraction by a Slit
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- 28 April 2020, pp. 3-4
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Materials Science Applications
Ultra-Microtome for the Preparation of TEM Specimens from Battery Cathodes
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- 01 September 2020, pp. 867-877
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Methods for Calibration of Specimen Temperature During In Situ Transmission Electron Microscopy Experiments
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- 20 January 2020, pp. 3-17
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Analysis of Electron Transparent Beam-Sensitive Samples Using Scanning Electron Microscopy Coupled With Energy-Dispersive X-ray Spectroscopy
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- 01 June 2020, pp. 373-386
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Plenary Session
Abstract
Melanin Through Deep Time: Experimental and Analytical Approaches to Decoding the Fossil Record of Melanin
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- 28 July 2020, p. 4
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Materials Science Applications
Plasma Focused Ion Beam Serial Sectioning as a Technique to Characterize Nonmetallic Inclusions in Superelastic Nitinol Fine Wires
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- 08 December 2020, pp. 1088-1099
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Determination of Mass Attenuation Coefficients of Th, U, Np, and Pu for Oxygen Kα X-Rays Using an Electron Microprobe
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- 30 April 2020, pp. 194-203
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Software and Instrumentation
Comparison of Orientation Mapping in SEM and TEM
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- 25 June 2020, pp. 630-640
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Automatic Fiber Length Measurements with a Multi-Stencil Fast Marching Method on Microscopy Images
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- 03 April 2020, pp. 387-396
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Comparison of Experimental STEM Conditions for Fluctuation Electron Microscopy
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- 27 August 2020, pp. 1100-1109
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Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
Causal Learning from Structural and Spectral Electron Microscopy Data
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- 28 July 2020, p. 6
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Software and Instrumentation
Digital Image Correlation of Forescatter Detector Images for Simultaneous Strain and Orientation Mapping
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- 06 July 2020, pp. 641-652
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